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基于TDC的无死区频率测量技术研究
引用本文:刘涛, 陈国超, 陈法喜, 赵侃, 董瑞芳, 张首刚. 基于TDC的无死区频率测量技术研究[J]. 电子与信息学报, 2021, 43(9): 2518-2525. doi: 10.11999/JEIT200807
作者姓名:刘涛  陈国超  陈法喜  赵侃  董瑞芳  张首刚
作者单位:1.中国科学院国家授时中心 西安 710600;;2.中国科学院时间频率基准重点实验室 西安 710600;;3.西安电子科技大学 西安 710071;;4.中国科学院大学 北京 100049
基金项目:中国科学院战略性先导科技专项(B类)(XDB21030200),广东省重点领域研发计划项目(2018B030325001)
摘    要:在精密时频测控领域中,高分辨率、无死区的时间间隔和频率测量非常关键,而时间数字转换器(Timeto Digital Converter,TDC)是时间频率测量的常用手段.该文研制了基于ACAM公司生产的时间数字转换芯片TDC-GP21和Altera公司FPGA芯片EP4CE6E22C8N的时间频率测量设备,实现了高分辨...

关 键 词:频率测量  时间间隔测量  时间数字转换器(TDC)  高精度  无死区
收稿时间:2020-10-28
修稿时间:2021-02-22

Research on Dead-time Free Frequency Measurement Technology Based on TDC
Tao LIU, Guochao CHEN, Faxi CHEN, Kan ZHAO, Ruifang DONG, Shougang ZHANG. Research on Dead-time Free Frequency Measurement Technology Based on TDC[J]. Journal of Electronics & Information Technology, 2021, 43(9): 2518-2525. doi: 10.11999/JEIT200807
Authors:Tao LIU  Guochao CHEN  Faxi CHEN  Kan ZHAO  Ruifang DONG  Shougang ZHANG
Affiliation:1. National Time Service Center, Chinese Academy of Sciences, Xi’an 710600, China;;2. Key Laboratory of Time and Frequency Standards, Chinese Academy of Sciences, Xi’an 710600, China;;3. Xidian University, Xi’an 710071, China;;4. University of Chinese Academy of Sciences, Beijing 100049, China
Abstract:In the fields requiring precise time and frequency measurement and control, high-precision, dead-time free time interval and frequency measurements are highly demanded. TDC (Time to Digital Converter) is commonly adopted in time and frequency measurement. In this paper, a self-developed multi-module time-interval measurement system is built based on the time digital conversion chip TDC-GP21 from ACAM company and the Cyclone IV FPGA chip EP4CE6E22C8N from Altera Company. For each time-interval measurement module, a time-interval measurement resolution as small as 13 ps is achieved. By further duplex operating two such time-interval measurement modules, a dead-time free frequency measurement is realized, the time and frequency measurement system involves three groups, each of which has 3 TDC chips. By averaging the measurement results of three TDC chips in each group, a frequency instability reaches $ 1.1times {10}^{-11} $@ 1s and $ 5.6times {10}^{-15} $@10000 s. This result shows that this self-developed apparatus approaches the performance of the commercial K+K FXE frequency counter. Due to its advantages of small size, no calibration and low cost, this apparatus can be widely used in applications that require high-precision time interval and precise frequency measurements.
Keywords:Frequency measurement  Time interval measurement  Time-to-Digital Converter (TDC)  High precision  Dead-time free
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