Ray representation of longitudinal lateral waves in acoustic microscopy |
| |
Authors: | Chan K H Bertoni H L |
| |
Affiliation: | Polytech. Univ., New York, NY. |
| |
Abstract: | For object materials having a large enough Rayleigh velocity, the V(z) (where V is the output voltage and z is the defocus distance) variation is mainly due to interference between the fields of the geometrically reflected wave and the leaky Rayleigh wave. However, for materials, such as organic compounds, having a low Rayleigh velocity, the leaky Rayleigh wave is not excited. For this case, the lateral wave resulting from propagation along the surface of the longitudinal wave plays a significant role in determining the V(z) dependence. The effect of the lateral wave contribution on V(z) is studied. Ray optics is to derive an expression giving the influence of the longitudinal lateral wave. Good agreement is found between the theory and measurements for z not near zero. Because of the ease with which the longitudinal wave velocity can be obtained from V(z), one can conveniently determine the elastic constant c(11 ) of isotropic materials using the acoustic microscope. |
| |
Keywords: | |
本文献已被 PubMed 等数据库收录! |
|