| 红外焦平面读出电路辐射特性研究 |
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| 引用本文： | 林加木,丁瑞军,陈洪雷,沈晓,刘非. 红外焦平面读出电路辐射特性研究[J]. 激光与红外, 2009, 39(8): 868-871 |
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| 作者姓名： | 林加木 丁瑞军 陈洪雷 沈晓 刘非 |
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| 作者单位： | 1. 中国科学院上海技术物理研究所,上海,200083;中国科学院研究生院,北京,100039
2. 中国科学院上海技术物理研究所,上海,200083 |
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| 摘 要： | 红外焦平面阵列在宇宙空间中使用时，受到各种辐射导致性能退化甚至功能失效。作为红外焦平面阵列的重要组成部分，CMOS读出电路受到各种辐射主要体现为电离辐射效应。通过对红外焦平面CMOS读出电路进行空间模拟辐射实验后，测试读出电路的功能以及性能参数，研究了辐射对读出电路的影响。实验结果为红外焦平面CMOS读出电路的抗辐射设计提供了参考依据。
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| 关 键 词： | 红外焦平面 读出电路 辐射效应 |
Radiation effects study of readout IC for the infrared focal plane arrays |
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| LIN Jia-mu,DING Rui-jun,CHEN Hong-lei,SHEN Xiao,LIU Fei. Radiation effects study of readout IC for the infrared focal plane arrays[J]. Laser & Infrared, 2009, 39(8): 868-871 |
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| Authors: | LIN Jia-mu DING Rui-jun CHEN Hong-lei SHEN Xiao LIU Fei |
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| Affiliation: | 1.Research Center for Advanced Material and Device;Shanghai Institute of Technical Physics;Chinese Academy of Sciences;Shanghai 200083;China;2.Graduate School of the Chinese Academy of Sciences;Beijing 100039;China |
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| Abstract: | When the infrared focal plane arrays(IRFPAs) is using in the space,its performance can be reduced or it will be disabled.As the important part of the IRFPAs,the CMOS readout integrated circuit(ROIC),which is under a variety of radiations,is mainly reflected by ionizing radiation effect.After the experiment of giving space radiations to the IRFPAs CMOS ROIC chips,the function and the performance parameters of ROIC chips are tested.The affections of the radiations to the ROIC chips are also studied.The results of the radiation experiment give the referenced gist for the radiation resistant design of the IRFPAs CMOS ROIC. |
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| Keywords: | infrared focal plane arrays readout integrated circuit radiation effect |
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