Microstructures of electrodeposited CdS layers |
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Authors: | JM Nel HL GaigherFD Auret |
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Affiliation: | Physics Department, University of Pretoria, Pretoria 0001, South Africa |
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Abstract: | Cadmium sulfide (CdS) thin films were electrodeposited on two conducting oxide substrates from aqueous solutions at temperatures between 30 and 90 °C. The as-deposited films were characterized using scanning electron microscopy, transmission electron diffraction, atomic force microscopy and Raman spectroscopy and were found to be crystalline at all temperatures. The microstructural development of the films is also discussed based on field emission scanning electron microscopy and atomic force microscopy studies. The composition of the films was found to be independent of the deposition temperature, with a slight difference in the Cd/S ratio on the different substrates. |
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Keywords: | Cadmium sulfide Structural properties Atomic force microscopy (AFM) Field emission microscopy (FEM) |
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