Structural and ferroelectric properties of europium doped lead zirconate titanate thin films by a sol-gel method |
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Authors: | Yan Ju Yu H.L.W Chan Fu Ping WangKun Li C.L ChoyLian Cheng Zhao |
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Affiliation: | a School of Materials Science and Engineering, Harbin Institute of Technology, Harbin, PR China b Department of Applied Physics, The Hong Kong Polytechnic University, Hunghom, Kowloon, Hong Kong, PR China |
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Abstract: | Using a sol-gel method, rare earth element europium doped lead zirconate titanate thin films with a pure perovskite structure were obtained. The effects of excess lead and pyrolyzing temperature on the crystalline structure of the thin films were investigated using X-ray diffraction. Their ferroelectric and dielectric properties were determined by P-E loop and impedance measurements. The remnant polarization is 23.5 μC/cm2 and the coercive electric field strength is 5.5 kV/mm. The dielectric constant and the dissipation factor is approximately 950 and 0.07, respectively. |
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Keywords: | Sol-gel process Rare earth dopant Dielectrics PZT thin films Ferroelectric properties |
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