| 常压制备SiO2气凝胶薄膜 |
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| 引用本文： | 马建华,孟祥建,孙璟兰,王根水,林铁,石富文,褚君浩.常压制备SiO2气凝胶薄膜[J].红外与毫米波学报,2004,23(6):465-468. |
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| 作者姓名： | 马建华 孟祥建 孙璟兰 王根水 林铁 石富文 褚君浩 |
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| 作者单位： | 中国科学院上海技术物理研究所,红外物理国家重点实验室,上海,200083 |
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| 基金项目： | 国家自然科学基金(60221502,60223006)和上海市A-M基金(0306)资助项目 |
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| 摘 要： | 采用溶胶-凝胶工艺在常压下制备了SiO2气凝胶薄膜,并用傅里叶红外光谱仪(FTIR)、扫描电子显微镜(SEM)、椭偏光谱仪等表征了薄膜的结构和性能.研究结果表明,气凝胶薄膜的折射率低达1.067,对应孔洞率为87.7%,密度为0.269×103kg·m-3,热导率为0.020W·m-1·K-1(300K)时,介电常数为1.52.这些优异性能的获得,主要归因于酸/碱两步催化、溶剂替换以及胶粒表面硅烷化等三个过程.
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| 关 键 词： | SiO2气凝胶 制备 薄膜 硅烷化 溶剂 凝胶工艺 压制 椭偏光谱 傅里叶红外光谱 结构和性能 |
| 文章编号： | 1001-9014(2004)06-0465-04 |
| 收稿时间： | 2003/7/11 |
| 修稿时间： | 2003年7月11日 |
SILICA AEROGEL THIN FILMS PREPARED AT AMBIENT PRESSURE |
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| MA Jian Hu,MENG Xiang Jian,SUN Jin Lan,WANG Gen ShuiLIN Tie,SHI Fu Wen,CHU Jun Hao.SILICA AEROGEL THIN FILMS PREPARED AT AMBIENT PRESSURE[J].Journal of Infrared and Millimeter Waves,2004,23(6):465-468. |
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| Authors: | MA Jian Hu MENG Xiang Jian SUN Jin Lan WANG Gen ShuiLIN Tie SHI Fu Wen CHU Jun Hao |
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| Abstract: | Silica aerogel thin films were prepared at ambient pressure by sol gel technique. Fourier transform infrared spectroscope(FTIR), scan electron microscope(SEM) and ellipsometer were used to characterize the structure and properties of the films. The refractive index of the resultant aerogel films is as low as 1.067, which corresponds to the porosity of 87.7 %, the density of 0.269×10 3 kg·m -3 , the thermal conductivity of 0.020W·m -1 ·K -1 (at 300K), and the dielectric constant of 1.52, These excellent properties mainly attribute to two step acid/base catalysis and the solvent exchange as well as the silylation on the surfaces of colloidal particles. |
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| Keywords: | silica aerogel thin films ambient pressure porosity |
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