干扰系数校正-电感耦合等离子体原子发射光谱法测定镍基合金中铈

在测定镍基合金中Ce时,考虑到Ce的常规分析线在多款仪器中均未找到或分析时不可用,因而很有必要找出相对强度高、干扰程度小的其他可用分析线.实验选用5～10 mL盐酸和1 mL硝酸溶解镍基合金,采用电感耦合等离子体原子发射光谱法(ICP-AES)和干扰系数法(IEC)相结合的方式,建立了镍基合金中Ce的分析方法.实验预先...

Determination of cerium in nickel-base alloy by inductively coupled plasma atomic emission spectrometry with interference coefficient correction

During the determination of Ce in nickel-base alloy, considering that the conventional analysis lines of Ce have not been found in many types of instruments or are not available, it is necessary to find other available analysis lines with high relative intensity and small interference degree. 5-10 mL of hydrochloric acid and 1 mL of nitric acid were used to dissolve nickel-base alloy, and the method for determination of Ce in nickel-base alloy by inductively coupled plasma atomic emission spectrometry (ICP-AES)-interference coefficient method (IEC) was established. A series of correlation analysis were carried out on more than twenty spectral lines selected from the Ce spectral line list by using Ce series standard solution. Six spectral lines were selected preliminarily, and the effects of acids and the interfering behavior of co-existing elements were further studied. By analyzing the results of interference experiments, Ce 404.076 nm, Ce 413.765 nm and Ce 456.236 nm were selected as the analytical lines for the determination of Ce in nickel-base alloy, in which Ce 404.076 nm was mainly interfered by Co and less interfered by V and Mn; Ce 413.765 nm was seriously interfered by W and Nb, and less interfered by Co, Ti and V; Ce 456.236 nm was seriously interfered by Ti, followed by Zr and Nb, and less interfered by Co and Mn. However, because V, Mn and Zr in nickel-base alloy were often doped as impurities, in order to simplify the calculation process effectively, the spectral lines were mainly used to correct or eliminate the interference of Co (404.076 nm), W and Nb (413.765 nm), Ti and Co (456.236 nm) when performing interference correction. Based on the analysis of nickel-base alloys (GH4099 and GH4133B), the determination results were consistent with the certified values after the correction of IEC, and the relative standard deviations (RSD, n=6) were less than 8.0%.