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多层胶接结构胶层均匀性的太赫兹时域表征方法
引用本文:王家天,刘闯,任姣姣,张丹丹,顾健.多层胶接结构胶层均匀性的太赫兹时域表征方法[J].红外与激光工程,2022,51(6):20210430-1-20210430-7.
作者姓名:王家天  刘闯  任姣姣  张丹丹  顾健
作者单位:1.长春理工大学 光电工程学院 光电测控与光信息传输技术教育部重点实验室,吉林 长春 130022
基金项目:吉林省科技资源开放共享服务平台与科研条件保障项目(20191004022TC);长春理工大学青年创新基金(XJJLG-2018-19)
摘    要:多层胶接结构广泛应用于航空航天领域中,其粘接强度是保障工程安全的关键因素。采用飞行时间、能量、幅值等不同的太赫兹时域光谱参数表征多层胶接结构胶层的均匀性,进而评价多层胶接结构材料的胶接质量。采用太赫兹时域光谱飞行时间成像法对胶层区域的均匀性进行定性分析,通过计算获得4块实验样件的飞行时间相对标准差分别为8.78%、8.09%、7.30%和9.57%,实现了胶层均匀性的定量评价;利用太赫兹时域光谱能量积分信息,分别采用能量积分曲线的峰度和偏度定性分析胶层均匀性,通过计算获得4块实验样件能量标准偏差分别为0.95、0.9、0.71和1.01,实现了胶层均匀性的定量评价;此外,根据太赫兹时域光谱的幅值特征信息,以幅值离散系数定量地表征胶层均匀性。研究结果表明:太赫兹时域光谱的飞行时间、能量积分及幅值3种特征参数均能够实现多层胶接结构胶层均匀性的定量评价,该方法能够为多层胶接结构粘接强度的评估提供可靠的手段。

关 键 词:胶层均匀性    太赫兹时域光谱    飞行时间    能量积分    幅值
收稿时间:2021-06-28

Terahertz time domain characterization method of the adhesive layer uniformity in multiple bonding structures
Affiliation:1.Key Laboratory of Photoelectric Measurement and Optical Information Transmission Technology of Ministry of Education, College of Optoelectronic Engineering, Changchun University of Science and Technology, Changchun 130022, China2.National Demonstration Center for Experimental Opto-Electronic Engineering Education, College of Optoelectronic Engineering, Changchun University of Science and Technology, Changchun 130022, China
Abstract:Multilayer bonding structure is widely used in aerospace field, and its bonding strength is the key factor to ensure engineering safety. Different terahertz time-domain spectroscopy parameters such as time-of-flight, energy and amplitude were used to characterize the uniformity of the adhesive layer of multilayer bonding structure, and then evaluate the bonding quality of multilayer bonding structure materials. The uniformity of the adhesive layer was qualitatively analyzed by the terahertz time-domain spectroscopy time-of-flight imaging method. The relative standard deviations of flight time of four experimental samples are 8.78%, 8.09%, 7.30% and 9.57% respectively; Using the energy integration information of terahertz time-domain spectroscopy, the kurtosis and skewness of the energy integration curve were used to qualitatively analyze the uniformity of the adhesive layer. The energy standard deviations of four experimental samples were 0.95, 0.9, 0.71 and 1.01, respectively; In addition, according to the amplitude characteristic information of terahertz time-domain spectroscopy, the uniformity of adhesive layer was quantitatively characterized by amplitude dispersion coefficient. The results show that the time-of-flight, energy integral and amplitude of terahertz time-domain spectroscopy can be use to quantitatively evaluate the adhesive layer uniformity of multi-layer adhesive structures. This method can provide a reliable means for evaluating the adhesive strength of multi-layer adhesive structures.
Keywords:
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