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Optical constants of electroplated Bi2Te3 films by Mueller matrix spectroscopic ellipsometry |
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| Authors: | A Zimmer L Johann C Boulanger |
| Affiliation: | a Laboratoire d'Electrochimie des Matériaux UMR CNRS 7555, Université Paul Verlaine-Metz, 1 Boulevard Arago, CP 87811, 57078 Metz Cedex 3, France b HORIBA Jobin-Yvon SAS, ZA de la Vigne aux Loups, 5 Avenue Arago, 91380 Chilly-Mazarin, France c Laboratoire de Physique des Milieux Denses, Université Paul Verlaine-Metz, 1 Boulevard Arago, CP 87811, 57078 Metz Cedex 3, France |
| Abstract: | We synthesized polycrystalline Bi2 + xTe3 − x (− 0.2< x <0.2) thin films by electrodeposition in acidic medium. Since Bi2Te3-like structure may be uniaxially anisotropic due to its rhombohedral crystallographic system, we investigated their optical behavior using ex and in situ Mueller matrix spectroscopic ellipsometry in the wavelength range of 470 to 830 nm (1.5-2.6 eV). We found that room-temperature electroplated polycrystalline appears optically isotropic and that no depolarization effect occurs from the first steps of growth until several micrometers thick films. Additional ex situ measurements permit to obtain their optical constants from far-ultraviolet to near-infrared (190-2100 nm). |
| Keywords: | Bismuth telluride Electrochemistry Electroplated films Ellipsometry Mueller matrix Optical properties Anisotropy In situ characterization |
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