Measurement of edge verticality of optical recording bits on blu‐ray discs using scanning probe microscopy |
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| Authors: | Sy‐Hann Chen Wen‐Siou Lin Wen‐Ching Wang |
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| Affiliation: | Department of Applied Physics, Institute of Optoelectronics and Solid State Electronics, National Chiayi University, Chiayi 600, Taiwan, Republic of China |
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| Abstract: | This work investigates recording bits on recordable and rewritable blu‐ray discs using atomic force microscopy and conducting atomic force microscopy with high contrast, respectively. The geometric structure of the recording bits is clearly observed in images, which, when coupled with cross‐section analysis, yields precise bit dimensions, and edge horizontal extended length values. The microscopic results are a valuable reference for increasing the recognition rate of digital signals in optical storage media. Furthermore, such a rapid and convenient measuring mode is an indispensable research tool for developing new recording materials and improving formation mechanisms. Microsc. Res. Tech., 2009. © 2009 Wiley‐Liss, Inc. |
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| Keywords: | recording bits blu‐ray discs atomic force microscopy conducting atomic force microscopy edge horizontal extended length |
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