首页 | 本学科首页   官方微博 | 高级检索  
     


Resonance properties and mass sensitivity of monolithic microcantilever sensors actuated by piezoelectric PZT thick film
Authors:Jae Hong Park  Tae Yun Kwon  Hyung Joon Kim  Seung Rae Kim  Dae Sung Yoon  Chae-Il Cheon  Hwan Kim  Tae Song Kim
Affiliation:(1) Microsystem Research Center, Korea Institute of Science and Technology, Seoul, 136-791, Korea;(2) Division of Material Science and Engineering, Seoul National University, Seoul, 151-744, Korea;(3) Department of Ceramic Engineering, Yonsei University, Seoul, 120-749, Korea;(4) Department of Materials Science and Engineering, Hoseo University, Cheonan, 336-795, Korea
Abstract:The PZT thick film cantilever devices fabricated via MEMS process have much attraction because they are appropriate for biological transducer or sensor, resulting from their large actuating force and relatively high sensitivity especially in liquid. By means of resonance behavior, theoretical calculation and experimental verification of the PZT thick film cantilever devices have not been studied before. Accordingly, we focused on the sensitivity analysis and interpretation of the PZT thick film cantilevers in this study. Especially, the investigation for mass sensitivity of the PZT thick film cantilever is of importance for physical, chemical and biological sensing application. The PZT thick film cantilever devices were constructed on Pt/TiO2/SiN X /Si substrates using screen printing method and MEMS process. The harmonic oscillation response (resonance frequency) was measured using an optical laser interferometric vibrometer. The effect of cantilever geometry on the resonance frequency change was investigated. Compared with the theoretical resonant frequency change by mass loading, the experimental resonant frequency change of the PZT micromechanical thick film cantilever shows a variation of less than 2%. Mass sensitivities are estimated to be 30.7, 57.1 and 152.0 pg/Hz for the 400 × 380 μm, 400 × 480 μm and 400 × 580 μm cantilever, respectively.
Keywords:Cantilever  Resonance  Sensitivity  PZT  Thick film
本文献已被 SpringerLink 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号