Methodology for the optimal component selection of electronic devices under reliability and cost constraints

The objective of this paper is to present an efficient computational methodology for the reliability optimization of electronic devices under cost constraints. The system modeling for calculating the reliability indices of the electronic devices is based on Bayesian networks using the fault tree approach, in order to overcome the limitations of the series–parallel topology of the reliability block diagrams. Furthermore, the Bayesian network modeling for the reliability analysis provides greater flexibility for representing multiple failure modes and dependent failure events, and simplifies fault diagnosis and reliability allocation. The optimal selection of components is obtained using the simulated annealing algorithm, which has proved to be highly efficient in complex optimization problems where gradient‐based methods can not be applied. The reliability modeling and optimization methodology was implemented into a computer program in Matlab using a Bayesian network toolbox. The methodology was applied for the optimal selection of components for an electrical switch of power installations under reliability and cost constraints. The full enumeration of the solution space was calculated in order to demonstrate the efficiency of the proposed optimization algorithm. The results obtained are excellent since a near optimum solution was found in a small fraction of the time needed for the complete enumeration (3%). All the optimum solutions found during consecutive runs of the optimization algorithm lay in the top 0.3% of the solutions that satisfy the reliability and cost constraints. Copyright © 2007 John Wiley & Sons, Ltd.