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Emissivity of substrate supported films |
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| Authors: | R. Raman H.K. Sehgal |
| Affiliation: | 1. Centre of Energy Studies, Indian Institute of Technology, Delhi Hauz Khas, New Delhi 110 016, India;2. Department of Physics, Indian Institute of Technology, Delhi Hauz Khas, New Delhi 110 016, India |
| Abstract: | Results of experimental measurements of emissivity carried out on cobalt oxide and nickel sulphide films deposited on aluminum substrates are reported in this paper. Experimental results supported the general behaviour of variation of emissivity with film thickness as reported theoretically. The theoretical model is based on the interaction and attenuation of the emitted wavelengths from the substrate and film materials. |
| Keywords: | Emissivity Extinction coefficient Refractive index Multiple reflections Temperature Stagnation |
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