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Variable energy positron beam study of Xe-implanted uranium oxide
Authors:Nikolay Djourelov  Benoît Marchand  Hristo Marinov  Nathalie Moncoffre  Yves Pipon  Patrick Nédélec  Nelly Toulhoat  Daniel Sillou
Affiliation:1. Institute for Nuclear Research and Nuclear Energy, Bulgarian Academy of Sciences, 72 Tzarigradsko Chaussee Blvd., BG-1784 Sofia, Bulgaria;2. Université de Lyon, Laboratoire IPNL, UCB Lyon 1, Bâtiment Paul Dirac 4, rue Enrico Fermi, 69622 Villeurbanne Cedex, France;3. AREVA, AREVA NP, 10 rue Juliette Récamier, 69 456 Lyon, France;4. Commissariat à l’Energie Atomique CEA/DEN, Centre de Saclay, 91191 Gif sur Yvette Cedex, France;5. Institut Universitaire de Technologie (IUT), Université Claude Bernard Lyon 1, 94 Bd. Niels Bohr, 69622 Villeurbanne Cedex, France;6. LMOPS, University of Savoie, Bâtiment IUT, 73376 Le Bourget-du-lac Cedex, France;1. Swerea-KIMAB, PO Box 55970, SE-10216 Stockholm, Sweden;2. Westinghouse Electric Sweden, SE-721 63 Västerås, Sweden;1. Department of Civil Engineering and Geological Sciences, University of Notre Dame, 156 Fitzpatrick Hall, Notre Dame, IN 46556, USA;2. Department of Chemistry, University of Iowa, Room E331 CB, Iowa City, IA 52242, USA;3. Department of Civil and Environmental Engineering, Southern Methodist University, P.O. Box 750340, Dallas, TX 75275, USA;1. Metallurgical and Materials Engineering, Colorado School of Mines, Golden, CO, USA;2. Fuel Cycle and Isotopes Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA;3. Nuclear Fuels and Materials Division, Idaho National Laboratory, Idaho Falls, ID, USA;4. Fuel Performance and Development, Idaho National Laboratory, Idaho Falls, ID, USA;1. Instituto de Engenharia Nuclear (IEN/CNEN – RJ), Caixa Postal 68550, 21945-970 Rio de Janeiro, RJ, Brazil;2. Indústrias Nucleares do Brasil (INB), Rod. Presidente Dutra, Km 330, Engenheiro Passos, CEP: 27555-00 Resende, RJ, Brazil;1. Department of Nuclear Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA 02139, USA;2. Center for Integrated Nanotechnologies, Sandia National Laboratories, Albuquerque, NM 87185, USA
Abstract:Doppler broadening of annihilation gamma-line combined with a slow positron beam was used to measure the momentum density distribution of annihilating pair in a set of sintered UO2 samples. The influence of surface polishing, of implantation with 800-keV 136Xe2+ at fluences of 1 × 1015 and 1 × 1016 Xe cm?2, and of annealing were studied by following the changes of the momentum distribution shape by means of S and W parameters. The program used for this purpose was VEPFIT. At the two fluences in the stoichiometric as-implanted UO2, formation of Xe bubbles was not detected. The post-implantation annealing and over-stoichiometry in the as-implanted sample caused Xe precipitation and formation of Xe bubbles.
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