| Research of the test generation algorithm based on search state dominance for combinational circuit |
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| 作者姓名： | 吴丽华 俞红娟 王轸 马怀俭 |
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| 作者单位： | College of Measure-control Technology ＆ Communication Engineering, Harbin University of Science anti Technology, Harbin 150040,China |
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| 摘 要： | PODEM,FANandSOCRATESalgorithmsallpresentafewstrategiesacceleratingthetestpatterngenerationbasedoncircuitstructure.PODEMalgo rithm1]introducesbacktrackingtechnology,anditre ferstestgenerationtoanimplicitenumerationprobleminn dimensionalspacesuchthatitbrea…
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| 关 键 词： | 组合电路 状态控制 测试生成算法 电路结构 |
| 文章编号： | 1005-9113（2006）01-0062-03 |
| 收稿时间： | 2004-11-08 |
Research of the test generation algorithm based on search state dominance for combinational circuit |
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| WU Li-hua,YU Hong-juan,WANG Zhen,MA Huan-jian.Research of the test generation algorithm based on search state dominance for combinational circuit[J].Journal of Harbin Institute of Technology,2006,13(1):62-64. |
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| Authors: | WU Li-hua YU Hong-juan WANG Zhen MA Huan-jian |
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| Abstract: | On the basis of EST (Equivalent STate hashing) algorithm, this paper researches a kind of test generation algorithm based on search state dominance for combinational circuit. According to the dominance relation of the E-frontier (evaluation frontier), we can prove that this algorithm can terminate unnecessary searching step of test pattern earlier than the EST algorithm through some examples, so this algorithm can reduce the time of test generation. The test patterns calculated can detect faults given through simulation. |
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| Keywords: | E-frontier test generation combinational circuit |
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