Evaluation of Concurrent Flaw Populations in Silicon Carbide in Terms of a Modified Weibull Distribution Function

Concurrent surface- and edge-flaw populations are often observed in strength testing of ceramics The overall strength distribution in such ceramic samples has been analyzed in terms of a modified Weibull distribution function. The junction provides an upper and lower strength limit and is characterized by two shape and location parameters. To evaluate the parameters of the distribution function, the type of flaw that causes failure need not be identified. The applicability of the function has been evaluated in terms of experimental results on SiC specimens. The analysis also shows that the relative values of shape parameters determine which flaw type dominates.