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Micromorphology characterization of copper thin films by AFM and fractal analysis |
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| Authors: | Ali Arman Ştefan Ţălu Carlos Luna Azin Ahmadpourian Mosayeb Naseri Mehrdad Molamohammadi |
| Affiliation: | 1. Young Researchers and Elite Club, Kermanshah Branch, Islamic Azad University, Kermanshah, Iran 2. Department of AET, Discipline of Descriptive Geometry and Engineering Graphics, Faculty of Mechanical Engineering, Technical University of Cluj-Napoca, 103-105 B-dul Muncii St., 400641, Cluj-Napoca, Cluj, Romania 3. Facultad de Ciencias Físico Matemáticas, Universidad Autónoma de Nuevo León, Av. Pedro de Alba s/n, 66455, San Nicolás de los Garza, Nuevo León, Mexico 4. Departments of Physics, Kermanshah Branch, Islamic Azad University, Kermanshah, Iran |
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