The effect of the signal-to-noise ratio in CBED patterns on the accuracy of lattice parameter determination |
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Authors: | Chuvilin Andrey Kups Thomas Kaiser Ute |
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Affiliation: | Institut für Festk?rperphysik, Friedrich-Schiller-Universit?t Jena, Max-Wien-Platz 1, D-07743 Jena, Germany. A.Chuvilin@microscopist.ru |
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Abstract: | A method of higher-order Laue zone line position measurement in convergent-beam electron diffraction (CBED) is proposed based on Hough transformation. A thorough analysis of the errors introduced by this measurement procedure is performed and their influence on the accuracy of lattice parameter determination is estimated. A criterion is derived which enables the accuracy to be predicted before experimental measurements are made and, thus, allows the selection of the best CBED geometry for parameter measurement. |
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