Characterization of Polyphasic Silicon Carbide Using Surface-Enhanced Raman and Nuclear Magnetic Resonance Spectroscopy |
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| Authors: | Neal R Dando M Azar Tadayyoni |
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| Affiliation: | Alcoa Laboratories, Alcoa Technical Center, Alcoa Center, Pennsylvania 15069;Department of Chemistry, Long Island University, Brooklyn, New York 11201 |
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| Abstract: | The present report explores the use of cross-polarization (CP) and single-pulse magic angle spinning nuclear magnetic resonance (MAS-NMR) as well as normal and surfaceenhanced Raman spectroscopy (SERS), in concert, for characterizing highly crystalline polymorphic silicon carbide ceramics. The combined use of these techniques provides a wealth of information regarding bulk, near-surface, and surface speciation. Both Raman and SERS are promising techniques for fracture surface characterization of these systems. The application of CPMAS-NMR and SERS to the study of ceramics is reported for the first time in this investigation. |
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| Keywords: | silicon carbide characterization Raman spectroscopy nuclear magnetic resonance solid state |
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