Modelling of boron nitride: Atomic scale simulations on thin film growth |
| |
Authors: | Karsten Albe,Wolfhard M ller |
| |
Affiliation: | Research Center Rossendorf, Institute of Ion Beam Physics and Materials Research, PO Box 51 01 19, D-01314, Dresden, Germany |
| |
Abstract: | Molecular-dynamics simulations on ion-beam deposition of boron nitride are presented. A realistic Tersoff-like potential energy functional for boron nitride, which was specially fitted to ab initio-data, has been used. The impact of energetic boron and nitrogen atoms on a c-BN target is simulated with energies ranging from 10 to 600 eV. The structural analysis of the grown films shows that a loose, dominantly sp2-bonded structure arises at high ion flux. In no case the formation of a sp3-bonded phase is observed, but the obtained films partially reveal textured basal planes as found in experiment. Two different growth regimes are identified for ion energies above and below 100 eV. |
| |
Keywords: | Molecular dynamics Boron nitride Thin film growth |
本文献已被 ScienceDirect 等数据库收录! |
|