基于威布尔分布的某半导体器件贮存寿命分布规律初探

对有机电致发光二极管（Organic Light-Emitting Diode，OLED）微型显示器件进行90℃、80℃、70℃的高温贮存试验，获得产品的失效数据。基于威布尔分布模型，采用最小二乘法进行参数估计，对失效数据分析，获得OLED微型显示器件失效分布函数。应用经典可靠性理论，计算产品在90℃、80℃、70℃的特征寿命、可靠寿命及平均故障间隔时间（Mean Time Between Failure，MTBF）。采用Arrhenius模型，依据90℃、80℃、70℃的贮存特征寿命，获得常温下产品的贮存特征寿命。分析结果表明，该方法合理、简便、有效，数据结果可以进一步应用到推导产品常温贮存寿命。

Preliminary Study on Storage Life Distribution of Semiconductor Device Based on Weibull Distribution

In this study, a semiconductor device was tested for high temperature storage at 90℃, 80℃ and 70℃, and the failure data is obtained. Based on the Weibull distribution model, parameter estimation was carried out by the least square method. The failure distribution function of the semiconductor device was obtained. And the classical reliability theory was applied to calculate the characteristic life, reliable life and MTBF of the product at 90℃, 80℃ and 70℃. Using the Arrhenius model, the storage characteristic life of the semiconductor device at room temperature was obtained, according to the storage characteristic life of 90℃, 80℃ and 70℃. The results show that the method is reasonable, simple and effective, and the results can be used to derive the normal temperature storage life.