| 嵌入式系统数据可靠性保证技术研究 |
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| 引用本文： | 杜隆胤. 嵌入式系统数据可靠性保证技术研究[J]. 电子质量, 2010, 0(9): 25-26 |
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| 作者姓名： | 杜隆胤 |
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| 作者单位： | 贵阳学院计科系,贵州贵阳,550003 |
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| 摘 要： | 针对嵌入式系统运行环境恶劣导致的内存数据跳变问题,本文根据数据的敏感性和更新频率进行将内存数据进行分类,探讨了使用冗余技术和辅助存储技术相结合的方法,以实现跳变数据的检错与纠错。
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| 关 键 词： | 嵌入式系统 敏感性 冗余 纠错 |
Research of Ensure Reliability of RAM Data in Embedded System |
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| Du Long-yin. Research of Ensure Reliability of RAM Data in Embedded System[J]. Electronics Quality, 2010, 0(9): 25-26 |
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| Authors: | Du Long-yin |
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| Affiliation: | Du Long-yin(Department of Computer Science,Guiyang College,Guizhou Guiyang 550003 ) |
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| Abstract: | In order to deal with the irregular change of RAM data caused by the bad environment in embedded system,this paper classifies the RAM data according to sensitivity end refreshing frequency.and then explores the combination of the two technologies, redundancy and storage to detect and correct the changed data. |
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| Keywords: | embedded system sensitivity redundancy：correct |
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