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光学薄膜厚度网络监控系统应用研究
引用本文:帅福利,黄光周,黎永志. 光学薄膜厚度网络监控系统应用研究[J]. 真空电子技术, 2007, 0(2): 5-8
作者姓名:帅福利  黄光周  黎永志
作者单位:华南理工大学电子与信息学院,广东,广州,510640
摘    要:以光电极值法为基本理论,以现代网络传输技术为基础,实现了光学薄膜厚度网络监控系统.文中主要描述了光电极值法的基本原理和网络监控系统的技术基础,并给出了详细实现方案及部署模型,最后通过实验验证了网络监控系统.

关 键 词:网络监控  光学薄膜
文章编号:1002-8935(2007)02-0005-04
修稿时间:2006-12-08

Application Study of an Optical Thin Film Thickness Network Monitor System
SHUAI Fu-li,HUANG Guang-zhou,LI Yong-zhi. Application Study of an Optical Thin Film Thickness Network Monitor System[J]. Vacuum Electronics, 2007, 0(2): 5-8
Authors:SHUAI Fu-li  HUANG Guang-zhou  LI Yong-zhi
Abstract:An optical thin film thickness network monitor system was realized by the basic theory of photoelectricity extremum method and the foundation of modern network communication technology.In this paper,the basic theory of photoelectricity extremum method and the foundation of modern network communication technology were introduced.Then the detailed scheme and deployed model were discussed.In the end,the network monitor system was validated by experiments.
Keywords:TCP/IP XML
本文献已被 CNKI 维普 万方数据 等数据库收录!
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