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LED加速寿命和可靠性试验
引用本文:无.LED加速寿命和可靠性试验[J].中国照明电器,2012(9):31-34.
作者姓名:
作者单位:浙江省半导体照明测试系统工程技术研究中心杭州远方光电信息股份有限公司光电科学研究所,浙江杭州,310053
摘    要:LED的寿命和可靠性得到了业界的高度重视,但其试验方法极具挑战。目前已有关于LED寿命试验的标准相继出台,然而不同区域的标准要求又有所不同。分析LED可靠性和寿命相关的关键指标,以北美体系和国际电工委员会(IEC)体系为主线,阐述LED加速寿命的试验方法,介绍具有我国自主知识产权的LED加速老化和寿命测试系统,其能够满足现有各种标准要求,实现方便、快速、精准的智能化试验。

关 键 词:LED  标准  加速老化试验  测试系统

Accelerated Life and Reliability Test of LEDs
Affiliation:Zhejiang SSL Test Engineering Research Center Institute of Optoelectronics of EVERFINE Corporation(Zhejiang Hangzhou 310053)
Abstract:The lifetime and reliability of LEDs have attracted much attention in the industry, but the testing methods are challenging. Some standards on lifetime test of LEDs have been issued, however, the requirements are not the same. This paper analyzes the key aspects that influence the reliability and lifetime of LEDs, and introduces the accelerated life test method for LEDs according to the North America and International Electrotechnical Commission (IEC) standards. At last, it introduces the "Aging & Life test system for LEDs", which owns independent intellectual property rights of China and conforms to the existing standards, and can realize convenient, accurate and intelligent life test.
Keywords:LED  standard  accelerated life test  measurement system
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