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Fatigue-less relaxor ferroelectric thin films with high energy storage density via defect engineer
Authors:Baijie Song  Shuanghao Wu  Hao Yan  Kun Zhu  Liuxue Xu  Bo Shen  Jiwei Zhai
Abstract:Thin film capacitors with excellent energy storage performances,thermal stability and fatigue endurance are strongly desired in modern electrical and electronic industry.Herein,we design and prepare lead-free 0.7Sr0.7Bi0.2TiO3-0.3BiFeO3-x%Mn(x=0,0.5,1.5,2,3)thin films via sol-gel method.Mn ions of divalent valence combine with oxygen vacancies,forming defect complex,which results in marked decline in leakage current and obvious enhancement in breakdown strength.A high energy storage density~47.6 J cm-3 and good efficiency~65.68%are simultaneously achieved in 2%Mn doped 0.7Sr0.7Bi0.2TiO3-0.3BiFeO3 thin film capacitor.Moreover,the 2%Mn-doped thin film exhibits excellent thermal stability in wide operating temperature range(35-115℃)and strong fatigue endurance behaviors after 108 cycles.The above results demonstrate that 2%Mn-doped 0.7Sr0.7Bi0.2TiO3-0.3BiFeO3 thin film capacitor with superior energy storage performances is a potential candidate for electrostatic energy storage.
Keywords:Relaxor ferroelectric thin films  Energy storage density  Defect engineer
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