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金相试样电解抛光机控制系统设计
引用本文:苏修武,姚骏,刘宇杰.金相试样电解抛光机控制系统设计[J].仪表技术,2014(9):12-15.
作者姓名:苏修武  姚骏  刘宇杰
作者单位:上海大学机电工程与自动化学院,上海200072
摘    要:针对目前市场上金相试样电解抛光设备的成本高、体积大、自动化程度低等问题,设计了一套基于嵌入式系统的电解抛光控制系统。系统以MSP430F1612微处理器为核心,通过对电流、电压以及温度等模拟量的采集和控制,实现了对电解抛光过程各个参数的测控。实验测量数据表明,系统达到了预期的参数指标,降低了成本,提高了自动化程度,对实际应用具有一定的指导意义。

关 键 词:电解抛光  嵌入式控制系统  单片机  多通道采样

Design of Control System for the Metallographic Sample Polishing Machine
SU Xiu-wu,YAO Jun,LIU Yu-jie.Design of Control System for the Metallographic Sample Polishing Machine[J].Instrumentation Technology,2014(9):12-15.
Authors:SU Xiu-wu  YAO Jun  LIU Yu-jie
Affiliation:(School of Meehatronie Engineering and Automation, Shanghai University, Shanghai 200072, China)
Abstract:In order to deal with the problems of the current metallographic sample polishing machine such as high cost, large size, low level of the automation, the electro-polishing control system based on the embedded system is designed in this paper. MCU MSP430F1612 acts as the core of this system. In order to implement expected control on parameters in the process of polishing, current, voltage and temperature are sampled and controlled by the system. The experimental data show that the system reaches the expected targets, reduces costs and improves the level of automation, and also has some guiding significance for practical application.
Keywords:eletro-polishing  embedded control system  MCU  multi-channel sampling
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