Scanning probe microscopy: Materials analysis with an added dimension

Encompassing such versatile analytical techniques as scanning tunneling microscopy and atomic (or scanning) force microscopy, scanning probe microscopes produce high-resolution three-dimensional images. Because of their power as quantitative tools for three-dimensional surface measurement and analysis, the techniques are being used in materials science and engineering for the study of a variety of advanced materials and for investigations into numerous phenomena, including reaction chemistry, crystallinity, kinetics, equilibrium processes, tribology, and conductivity.