首页 | 本学科首页   官方微博 | 高级检索  
     

密封电子元器件微粒碰撞噪声自动检测系统的研究
引用本文:王世成,王国涛,翟国富,王传延. 密封电子元器件微粒碰撞噪声自动检测系统的研究[J]. 计算机与数字工程, 2010, 38(9): 1-4,12
作者姓名:王世成  王国涛  翟国富  王传延
作者单位:1. 哈尔滨工业大学军用电器研究所,哈尔滨,150001;陆军航空兵学院直升机机载设备系,北京,101123
2. 哈尔滨工业大学军用电器研究所,哈尔滨,150001
3. 集诚泰斯特测试技术有限公司,北京,100088
摘    要:密封电子元器件内部存在多余物,多年来一直是困扰其应用与发展的关键因素。针对以往多余物微粒碰撞噪声检测(PIND)系统中存在检测精度低、误判和漏判率高等问题,文章提出一种基于小波分析的多余物自动检测方法,研制了具有自主知识产权的密封电子元器件微粒碰撞噪声检测系统。实验结果表明,检测系统运行稳定,性能优异,用户界面友好,各项技术指标均优于国际同类产品。文章提出的检测方法亦适用于其他航天产品的多余物检测。

关 键 词:密封电子元器件  多余物  微粒碰撞噪声检测

Research on Particle Impact Noise Auto Detecting System for Sealed Electronic Components
Wang Shicheng,Wang Guotao,Zhai Guofu,Wang Chuanyan. Research on Particle Impact Noise Auto Detecting System for Sealed Electronic Components[J]. Computer and Digital Engineering, 2010, 38(9): 1-4,12
Authors:Wang Shicheng  Wang Guotao  Zhai Guofu  Wang Chuanyan
Affiliation:Wang Shicheng1),2) Wang Guotao1) Zhai Guofu1) Wang Chuanyan3)(Military Apparatus Institute,Harbin Institute of Technology1),Harbin 150001)(Helicopter Airborne Equipments Department,Army Ariation Institute2),Beijing 101123)(Beijing Jicheng Test Technology Co.,Ltd3),Beijing 100088)
Abstract:The existence of remainder particles in sealed electronic components become a large problem from ist application and development.Due to traditional Particle Impact Noise Detection(PIND) system for remainder detection with low precision,high leave out rate and wrong judgment rate,this paper presents a remainder auto detecting method based on wavelet analysis,designs a particle impact noise auto detecting system for sealed electronic components with self-owned intellectual property rights.The experiment resul...
Keywords:sealed electronic components  remainder  PIND  
本文献已被 CNKI 维普 万方数据 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号