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Benefits of Integrated-Circuit Burn-In to Obtain High Reliability Parts
Authors:Pantic  Dragan
Affiliation:Siliconix Inc., Santa Clara;
Abstract:The technique of integrated circuit (IC) burn-in is applied industry-wide with the assumption that burned-in ICs have a much lower failure rate during operating life than ICs which are not burned-in. Several years ago this approach was valid for all ICs, but today burn-in procedures for some ICs provide little, if any, benefit. However, some customers still request burned-in ICs, assuming that this will produce better reliability. This paper provides historical data for linear ICs and presents a procedure to help the user determine if burn-in is worthwhile. An example for linear ICs where minimum benefit produced from burn-in is provided. By repeating this exercise with any other parts, the user can decide whether burn-in will decrease the failure rate appreciably for his application. This article deals specifically with decreases in failure rates through burn-in. It is not within the scope of this paper to describe general factors that could decrease failure rates.
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