| 微离轴干涉显微系统中光学参数的确定 |
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| 引用本文： | 程伟,江超,薛亮,魏春娟,初凤红. 微离轴干涉显微系统中光学参数的确定[J]. 上海电力学院学报, 2017, 33(1): 30-32,38 |
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| 作者姓名： | 程伟 江超 薛亮 魏春娟 初凤红 |
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| 作者单位： | 上海电力学院 电子与信息工程学院,上海电力学院 电子与信息工程学院,上海电力学院 电子与信息工程学院,上海电力学院 电子与信息工程学院,上海电力学院 电子与信息工程学院 |
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| 基金项目： | 国家自然科学基金（61205081）；上海市教育委员会科研创新项目（13YZ102）；上海市大学生科技创新项目（201210256026）. |
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| 摘 要： | 着重分析了微离轴干涉理论,通过自(互)相关理论确定了微离轴干涉中物参角的大小,由此推得干涉条纹的最佳空间频率.通过与传统干涉法的实验结果对比发现,微离轴干涉成像重建精度高.此外,不同直径的细胞应合理选用不同倍率的物镜,有助于提高后期相位重建的准确度,为进一步提高干涉测量的速度和准确度提供了新方法.
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| 关 键 词： | 微离轴干涉 共焦显微 层析 空间频率 |
| 收稿时间： | 2016-03-16 |
Determination of Optical Parameters in Slightly-off-axis Interference Microscopy |
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| CHENG Wei,JIANG Chao,XUE Liang,WEI Chunjuan and CHU Fenghong. Determination of Optical Parameters in Slightly-off-axis Interference Microscopy[J]. Journal of Shanghai University of Electric Power, 2017, 33(1): 30-32,38 |
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| Authors: | CHENG Wei JIANG Chao XUE Liang WEI Chunjuan CHU Fenghong |
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| Affiliation: | School of Electronics and Information Engineering, Shanghai University of Electric Power, Shanghai 200090, China,School of Electronics and Information Engineering, Shanghai University of Electric Power, Shanghai 200090, China,School of Electronics and Information Engineering, Shanghai University of Electric Power, Shanghai 200090, China,School of Electronics and Information Engineering, Shanghai University of Electric Power, Shanghai 200090, China and School of Electronics and Information Engineering, Shanghai University of Electric Power, Shanghai 200090, China |
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| Abstract: | Slightly-off-axis interferometry theory is introduced and the angle between the object and sample path is calculated via the auto-correlation(cross-correlation) theory.According to this special angle,the optimized fringe spacing is introduced.The slightly-off-axis interference system is compared with on-axis and off-axis interferometry,which is good for high resolution.It is concluded that the biological cells with different size should choose the proper micro objective.As a result,it is convenient for the experiment operating and the enhancement of the phase reconstruction accuracy.The above results shed more lights on novel interferometry. |
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| Keywords: | slightly-off-axis interferometry confocal microscopy tomography fringe spatial frequency |
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