基于近红外和中红外光谱技术的小麦粉品质检测及掺杂鉴别方法

针对国家标准法检测小麦粉品质的传统方法存在一定缺陷，提出基于近红外光谱和中红外光谱技术快速检测面粉的方法，并基于偏最小二乘法建立了矫正模型，对小麦粉的灰分、水分、面筋品质指标进行了分析。对于小麦粉的掺杂鉴别问题，基于标准法测光谱距离建立了聚类分析模型，结果表明，可实现对小麦面粉品质的快速检测及掺杂鉴别。

Determination of Wheat Flour Adulteration Based on Near- and Mid-Infrared Spectroscopy

A rapid method for the identification of wheat flour adulteration using near- and mid-infrared (NIR-MIR)
spectroscopy was proposed to overcome the shortcomings of the conventional method described in the Chinese national
standard. A calibration model was established using partial least squares regression analysis, and chemical analysis of wheat
flour was performed for ash, moisture and gluten. Moreover, a clustering analysis model was developed based on the spectral
distances measured by the standardized method to identify wheat flour adulteration. Our experimental results confirm that
this NIR-MIR spectroscopic method permits the rapid identification of wheat flour adulteration.