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Behavior Study of the Nanostructured Zn1-xCdxO (0 ≤ x ≤ 0.1) Semiconductor Thin Films Deposited onto Silicon Substrate by Dip-Coating Method
Authors:Rahal  Badis  Boudine  Boubekeur  Souami  Nassim  Siad  Menouar  Sebais  Miloud  Halimi  Ouahiba  Guerbous  Lakhdar
Affiliation:1.Nuclear Research Center of Algiers, 2 Bd., Frantz Fanon, BP 399, 16000, Algiers, Algeria
;2.Crystallography Laboratory, Physics Department, Faculty of Exact Sciences, Mentouri Brothers Constantine 1 University, Route Ain El Bey, 25000, Constantine, Algeria
;
Abstract:Silicon - The specimens of nanostructured semiconductor of Zn1-xCdxO (0 ≤ x ≤ 0.1) thin films were grown on silicon substrate using a dip-coating method. The...
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