首页 | 本学科首页   官方微博 | 高级检索  
     


Stress analysis in new improved differential vertical comb capacitive micro accelerometer using SOI technology
Authors:Dounkal  Manoj Kumar  Bhan  R K  Kumar  Navin
Affiliation:1.Solid State Physics Laboratory, Lucknow Road, Timarpur, Delhi, 110054, India
;2.Institute of Defence Scientists and Technologists, Mazumdar Marg, Timarpur, Delhi, 110054, India
;3.Indian Institute of Technology, Ropar, Ropar, 140001, India
;
Abstract:Microsystem Technologies - Recently a new improved differential vertical comb type capacitive accelerometer using silicon on insulator (SOI) technology reported having better performance than...
Keywords:
本文献已被 SpringerLink 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号