| Abstract: | This paper deals with multiple-fault diagnosis for linear analogue circuits. the proposed approach is based on multifrequency measurements of some voltage (transfer function) at the accessible output port and can be used for multiple-fault location. It uses certain algebraic invariant properties of the transfer function with respect to the set of faulty elements. Computationally this approach reduces checking the problem of multiple-fault diagnosis to one of the existence or non-existence of a common solution of two systems of linear equations; this amounts to the finding of the rank of a matrix. These linear equations are derived via symbolic representation of the measured voltage (transfer function) accessible for measurements. A numerical example of the application of such an approach is given. |
