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Electron microscope study of surface topography by geometrical determination of metric characteristics of surface elements
Authors:S. Simov  E. Simova  B. Davidkov
Abstract:Three micrographs made at different tilting angles are necessary to determine the spatial coordinates of each point from the surface of micro-object. The x′ and y′ coordinates of the points are measured in an arbitrary coordinate system O'X′Y′ which ensures convenience in measurements. The coordinates measured are transformed into a main coordinate system OXYZ related to the microscope and the image plane. The z coordinates are calculated. The coordinates of the points are used to solve the following metric problems by applying analytical geometry: computation of (1) distances (between: two points, a point and a straight line, a point and a plane), (2) angles (between: two straight lines, a straight line and a plane, two planes), (3) area of a triangle and (4) volume of a body, which may devided into tetrahedra. A computer program for solving the above problems is written in BASIC.
Keywords:Electron microscopy  quantitative microscopy  surface structure  surface topography  microforms
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