X-ray diffraction and Raman scattering in SbSI nanocrystals |
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Authors: | A.V. GomonnaiI.M. Voynarovych A.M. SolomonYu.M. Azhniuk A.A. KikineshiV.P. Pinzenik M. Kis-VargaL. Daroczy V.V. Lopushansky |
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Affiliation: | a Institute of Electron Physics, Ukranian National Academy of Science, Universytetska St. 21, Uzhhorod 88017, Ukraine b Uzhhorod National University, Pidhirna St. 46, Uzhhorod 88000, Ukraine c Institute of Nuclear Research, Hungarian Academy of Science, P.O. Box 51, Debrecen 4001, Hungary d Department of Solid State Physics, University of Debrecen, P.O. Box 2, Debrecen 4010 Hungary |
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Abstract: | Lattice structure and rod-like shaped SbSI nanocrystals obtained by ball milling with rod thickness down to 70 nm, as estimated from X-ray diffraction (XRD) and electron microscopy, is similar to that of the bulk crystals. The dependence of the grain size on the milling duration is discussed in view of the chain-like crystalline structure of SbSI. Possible factors, responsible for the observed Raman line broadening, are discussed, scattering by surface phonons being considered the predominant one. |
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Keywords: | A. Inorganic compounds A. Nanostructures C. Raman spectroscopy C. X-ray diffraction |
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