Electron-probe microanalysis of doped PbTe and Pb0.8Sn0.2Te single crystals |
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| Authors: | M. V. Bestaev A. I. Gorelik V. A. Moshnikov Yu. M. Tairov |
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| Affiliation: | (1) St. Petersburg State Electrical Engineering University, 197376 St. Petersburg, Russia |
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| Abstract: | The distribution of the elements in naturally faceted PbTe and Pb0.8Sn0.2Te single crystals doped with zinc and cadmium is analyzed. The results show the formation of a multilayer structure with an outer layer of ZnTe (CdTe) on top of a metallic sublayer. Fiz. Tekh. Poluprovodn. 31, 980–982 (August 1997) |
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