| Abstract: | Trapped protons and electrons in the Earth’s radiation belts and cosmic rays present significant challenges for electronics that must operate reliably in the natural space environment. Single event effects (SEE) can lead to sudden device or system failure, and total dose effects can reduce the lifetime of a space-based telecommunications system. One of the greatest sources of uncertainty in developing radiation requirements for a space system is accounting for the small but finite probability that the system will be exposed to a massive solar particle event. Once specifications are decided, standard laboratory tests are available to predict the total dose response of MOS and bipolar components in space, but SEE testing of components can be more challenging. Prospects are discussed for device modeling, and for the use of commercial electronics in space. In addition, technology trends are discussed for the radiation response of microelectronics in space. |
