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基于DSP芯片的液晶特性专用测试仪研制
引用本文:高蒙,程兰,万京.基于DSP芯片的液晶特性专用测试仪研制[J].现代电子技术,2006,29(1):86-88,91.
作者姓名:高蒙  程兰  万京
作者单位:石家庄铁道学院,河北,石家庄,050043
摘    要:以TMS320LF2407DSP芯片为核心研制了一种液晶特性专用测试仪,测试液晶材料在不同电压和不同频率的电性能,得到被测材料在高压情况下的一系列响应特性,为研究其击穿特性和失效机理提供直接实验数据,为液晶显示材料的选择提供重要依据。介绍了液晶特性专用测试仪的功能、测试原理、系统组成、主要硬件电路和软件设计思想。

关 键 词:液晶材料  DSP  特性测试仪  击穿特性  失效机理
文章编号:1004-373X(2006)01-086-03
收稿时间:2005-10-18
修稿时间:2005-10-18

Design of Liquid Crystal Characteristic Tester in Special Purposes Based on DSP
GAO Meng,CHENG Lan,WAN Jing.Design of Liquid Crystal Characteristic Tester in Special Purposes Based on DSP[J].Modern Electronic Technique,2006,29(1):86-88,91.
Authors:GAO Meng  CHENG Lan  WAN Jing
Affiliation:Shijiazhuang Railway Institute,Shijiazhuang,050043,China
Abstract:In this paper,a device of liquid crystal characteristic testing in special purposes based on TMS320LF2407 is designed,the DSP chip TMS320LF2407 is used as control unit.The characteristics of the material on the diverse voltage and different frequency are tested.A series of respond characteristic is gained in high voltage status.Direct test data of the material is offered for studying the breakdown characteristics and failure mechanism.These results provide fundamental basis for the choice of crystal display material.The system frames of the hardware circuits and the software are analyzed.The functions and the design methods are described.
Keywords:material of liquid crystal  DSP  characteristic tester  breakdown characteristic  failure mechanism
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