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A Full Coverage Test Method for Configurable Logic Blocks in FPGA |
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| Authors: | FU Yong WANG Chi CHEN Liguang LAI Jinmei |
| Affiliation: | State Key Laboratory of ASIC and System, Fudan University, Shanghai 201203, China |
| Abstract: | Field programmable gate array （FPGA）,Conflgurable logic block, Fault coverage, Test. |
| Keywords: | Field programmable gate array （FPGA） Conflgurable logic block Fault coverage Test |
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