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Fabrication of n-ZnO/p-Si++ Hetero-junction Devices for Hydrogen Detection: Effect of Annealing Temperature
Authors:Kumar  Vipin  Rawal  Ishpal  Kumar  Vinod
Affiliation:1.Department of Electronics and Communication Engineering, SRM-Institute of Science and Technology, Ghaziabad, UP, 201204, India
;2.Department of Physics, Kirori Mal College, University of Delhi, Delhi, 110007, India
;
Abstract:Silicon - In the present study, we report the fabrication of n-ZnO/p-Si++ hetero-junction devices for the detection of hydrogen leakage in ambient air environment. For the fabrication of...
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