首页 | 本学科首页   官方微博 | 高级检索  
     

基于事件约束的软件过程验证
引用本文:顾庆,陈道蓄. 基于事件约束的软件过程验证[J]. 软件学报, 2005, 16(10): 1735-1742
作者姓名:顾庆  陈道蓄
作者单位:计算机软件新技术国家重点实验室(南京大学),江苏,南京,210093;计算机软件新技术国家重点实验室(南京大学),江苏,南京,210093
基金项目:Supported by the National High-Tech Research and Development Plan of China under Grant Nos.2003AA 113090, 2004AA 112090(国家高技术研究发展计划(863))
摘    要:软件过程是以人为中心的系统,其特点是动态性和不断演化.既定过程模型在实际执行时往往有所偏差.基于E-CSPE(extended constraints on succeeding and proceeding events)约束实现过程验证和偏差测量.事件约束根据过程模型定义.过程实例执行被记录为事件序列.通过分析事件序列对事件约束的覆盖和违反结果,可以计算EPD(event constraint based process difference metric)和EAD(event constraint based activity deviation metric)指标.EPD指标可以反映过程执行与过程模型的偏差,EAD指标则为过程演化提供依据.

关 键 词:软件工程  软件过程  软件过程改进  过程模型  过程验证  事件约束
收稿时间:2004-06-15
修稿时间:2005-06-10

Event Constraint Based Software Process Validation
GU Qing and CHEN Dao-Xu. Event Constraint Based Software Process Validation[J]. Journal of Software, 2005, 16(10): 1735-1742
Authors:GU Qing and CHEN Dao-Xu
Abstract:Software process is a human-centered system, with special characteristics in dynamic and continuous evolvement. The physical execution of a defined process will normally deviate from its process model. This paper uses E-CSPE (extended constraints on succeeding and proceeding events) constraints to carry out process validation and deviation measurement. The event constraints are defined based on the process model. The execution of a process instance is recorded down as an event sequence. The event sequence is analyzed to determine how much each event constraint defined is covered or violated. The result can be used to compute the EPD (event constraint based process difference metric) and EAD (event constraint based activity deviation metric) metrics. The EPD metric can reflect the difference between the process execution and its process model, while the EAD metric can provide some evidence for process evolvement.
Keywords:software engineering  software process  software process improvement  process model  process validation  event constraint
本文献已被 CNKI 维普 万方数据 等数据库收录!
点击此处可从《软件学报》浏览原始摘要信息
点击此处可从《软件学报》下载全文
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号