| 集成电路振荡频率的性能测试 |
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| 引用本文： | 姚海燕.集成电路振荡频率的性能测试[J].电脑与信息技术,2014,22(6):26-28. |
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| 作者姓名： | 姚海燕 |
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| 作者单位： | 江苏省南通中等专业学校,江苏南通,226011 |
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| 摘 要： | LCPU01是岭芯微电子公司的一款用于无线网卡的电源管理类IC,内部包含了一个同步降压转换器、九个高速LDO和一个反相器用来与外部晶振构成振荡电路。实际芯片测试时,通过合理设置晶振两端的电容容量,可以加速晶振起振,增加频率测试的稳定性、减少测试时间,最终提高芯片测试效率。
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| 关 键 词： | LCPU 晶振 电容容量 加速 芯片测试 |
The Performance Test of IC's Oscillation Frequency |
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| YAO Hai-yan.The Performance Test of IC's Oscillation Frequency[J].Computer and Information Technology,2014,22(6):26-28. |
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| Authors: | YAO Hai-yan |
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| Affiliation: | YAO Hai-yan(Jiangsu Nantong Vocational School,Nantong 226011,China) |
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| Abstract: | LCPU01 is a kind of power management IC used for wireless network adapter in Shanghai LeadChip Microelectronics Corp. Ltd. It includes a synchronous step-down converter, nine high-speed LDO and a inverting amplifier composing oscillation circuit with extem crystal. By setting proper capacitance, it will accelarate oscillation,increase test stability,decrease test time and promote IC test efficiency. |
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| Keywords: | LCPU01 crystal capacitance accelarate IC test |
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