Characterization and deblurring of lateral crosstalk in CMOS image sensors |
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Authors: | Ji Soo Lee Shah J Jernigan ME Hornsey R |
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Affiliation: | Micron Imaging, Boise, ID, USA; |
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Abstract: | Lateral crosstalk in CMOS imaging arrays deter effective utilization of small pixel sizes (e.g., < 5.0 /spl mu/m /spl times/ 5.0 /spl mu/m) now permitted by technology scaling. A simple measurement setup for empirical characterization of lateral crosstalk in CMOS image sensors is presented. A demonstration of deblurring operations based on the obtained blur model of lateral crosstalk is also provided. Several well-known linear deconvolution filters are employed in the demonstration. The tradeoffs in sharpness restoration, high-frequency noise amplification, and the intensity clipping effect in the design of linear deblurring operation for the application of lateral crosstalk are illustrated. |
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