| 插层Bi对NiFe/FeMn双层膜交换偏置场的影响及其XPS分析 |
| |
| 引用本文： | 李明华,于广华,朱逢吾,曾德长,赖武彦. 插层Bi对NiFe/FeMn双层膜交换偏置场的影响及其XPS分析[J]. 功能材料, 2005, 36(12): 1834-1836 |
| |
| 作者姓名： | 李明华 于广华 朱逢吾 曾德长 赖武彦 |
| |
| 作者单位： | 华南理工大学,机械学院,广东,广州,510640;北京科技大学,材料物理系,北京,100083;北京科技大学,材料物理系,北京,100083;华南理工大学,机械学院,广东,广州,510640;中国科学院物理研究所,北京,100080 |
| |
| 基金项目： | 国家自然科学基金资助项目（50471093,50271007） |
| |
| 摘 要： | 在Ta／Cu／NiFe／FeMn／Ta薄膜中，我们曾发现Cu在NiFe层的表面偏聚导致NiFe／FeMn薄膜的交换偏置场降低。为了抑制Cu的表面偏聚，我们在Ta／Cu／NiFe／FeMn／Ta薄膜中在Cu／NiFe界面沉积Bi插层。实验发现，沉积适当厚度的Bi插层可以将NiFe／FeMn双层膜的交换偏置场提高1倍。XPS分析表明，在Cu／NiFe界面沉积的插层Bi有效地抑制了Cu在NiFe表面的偏聚，提高了交换偏置场。
|
| 关 键 词： | NiFe/FeMn 交换偏置场Hex 表面偏聚 Bi插层 |
| 文章编号： | 1001-9731(2005)12-1834-03 |
| 收稿时间： | 2005-04-07 |
| 修稿时间： | 2005-07-30 |
The influence of Bi on the exchange bias field of NiFe/FeMn bilayers and the XPS analysis |
| |
| LI Ming-hua,YU Guang-hua,ZHU Feng-wu,ZENG De-chang,LAI Wu-yan. The influence of Bi on the exchange bias field of NiFe/FeMn bilayers and the XPS analysis[J]. Journal of Functional Materials, 2005, 36(12): 1834-1836 |
| |
| Authors: | LI Ming-hua YU Guang-hua ZHU Feng-wu ZENG De-chang LAI Wu-yan |
| |
| Affiliation: | 1. College of Mechanical Engineering, South China University of Technology, Guangzhou 510640, China; 2. Department of Materials Physics, University of Science and Technology Beijing, Beijing 100083, China;3. Institute of Physics, Chinese Academy of Sciences, Beiiing 100080, China |
| |
| Abstract: | Experimental results show that Cu atoms can segregate to the NiFe surface in Ta/Cu/NiFe/FeMn/Ta films.This segregation results in a decrease of the exchange bias field(Hex) of NiFe/FeMn.In order to suppress the Cu surface segregation,we deposited Bi insetting layers at the interface of Cu and NiFe in Ta/Cu/NiFe/FeMn/Ta films.We found that the Hex of NiFe/FeMn can be doubled when the proper Bi was deposited.XPS analysis shows that Bi insetting layers deposited at the interface of Cu/NiFe effectively suppress the Cu segregation on the NiFe surface.As a result,the Hex was increased. |
| |
| Keywords: | NiFe/FeMn exchange coupling field(Hex) surface segregation Bi insetting layer |
| 本文献已被 CNKI 维普 万方数据 等数据库收录！ |
|
