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Why RTL ATPG?
作者姓名:闵应骅
作者单位:InstituteofComputingTchnology,TheChineseAcademyofSciences,Beijing100080,P.R.China
摘    要:Register Transfer Level(RTL)Automatic Test Pattern Generation(ATPG) has been of wide conceran for two decades .Meanwhile gate-level ATPG has made remarkable progress in dealing with large circuits.An argument is then posed.Do we need RTL ATPG in the case of gate-level ATPG capable of generating tests for large circuits? This paper attempts to answer this question .The necessity,difficulty,and major interests of RTL ATPG are reviewed.

关 键 词:自动测试模式生成器 寄存器传输级 集成电路
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