Why RTL ATPG? |
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作者姓名: | 闵应骅 |
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作者单位: | InstituteofComputingTchnology,TheChineseAcademyofSciences,Beijing100080,P.R.China |
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摘 要: | Register Transfer Level(RTL)Automatic Test Pattern Generation(ATPG) has been of wide conceran for two decades .Meanwhile gate-level ATPG has made remarkable progress in dealing with large circuits.An argument is then posed.Do we need RTL ATPG in the case of gate-level ATPG capable of generating tests for large circuits? This paper attempts to answer this question .The necessity,difficulty,and major interests of RTL ATPG are reviewed.
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关 键 词: | 自动测试模式生成器 寄存器传输级 集成电路 |
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