Study of the Choice of Excitation Frequency for Sub Surface Defect Detection in Electrically Thick Conducting Specimen Using Eddy Current Testing

Understanding the scope and limitations of non-destructive testing procedure is essential for selecting the appropriate test parameters for material inspection. This paper presents the scope of material (\( \delta_{s} \)) and probe dependent (\( \delta_{t} \)) penetration depths for determining the optimal test frequency (\( f_{opt} ) \) for detection of sub surface defects in electrically thick conducting specimens. Numerical modelling is carried out for a pancake coil above an electrically thick aluminium plate, \( t/\delta_{t} \)?>?1, to study the influence of the EC probe and defect location (\( t_{df} \)) on the test frequency for near and deep sub surface defects. The study concludes that the optimal test frequency, \( f_{opt} \) for detection of deep sub surface defects (\( t_{df} /t \approx 1 \)) is determined by the probe dependent skin depth, \( \delta_{t} \), and the plate thickness is related to \( f_{opt} \) by, \( t \propto 1/\sqrt {f_{opt} } \). The numerical observations were experimentally validated for machined sub surface notches on a 10 mm thick (\( t \)) aluminium plate.