| 基于二值投影的PCB元件安装缺陷检测算法研究 |
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| 引用本文： | 程良伦,江伟欢.基于二值投影的PCB元件安装缺陷检测算法研究[J].计算机工程与设计,2010,31(3). |
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| 作者姓名： | 程良伦 江伟欢 |
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| 作者单位： | 广东工业大学,自动化学院,广东,广州,510006 |
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| 基金项目： | 广东省教育部产学研结合基金项目 |
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| 摘 要： | 研究分析了适用于AOI设备的PCB表面安装元件的缺陷检测算法.使用二值投影分析方法对2种元件类型的缺陷检测方法进行了研究,包括针对贴片电阻电容类型的chip元件和集成电路芯片类型的IC元件的缺陷检测方法.使用VC++6.0编写MFC程序实现算法,并制作了各种元件图像进行实验测试.实验结果表明,提出的方法能够快速有效的对两种类型的元件安装缺陷进行检测.
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| 关 键 词： | 表面安装技术 缺陷检测 二值投影 自动光学检测 印刷电路板 |
Research of defect inspection algorithm of SMD based on binary-projection on PCBs |
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| CHENG Liang-lun,JIANG Wei-huan.Research of defect inspection algorithm of SMD based on binary-projection on PCBs[J].Computer Engineering and Design,2010,31(3). |
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| Authors: | CHENG Liang-lun JIANG Wei-huan |
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| Affiliation: | CHENG Liang-lun,JIANG Wei-huan (Faculty of Automation,Guangdong University of Technology,Guangzhou 510006,China) |
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| Abstract: | The defect inspection algorithm of SMD on PCBS which is applicable to AOI equipments is analyzed.The binary-projection method is proposed,and is used to inspect two types of SMD.The chip-type includes capacitors and resistors,and the IC-type,that's integrated circuit chip component.MFC program is developed under VC++6.0 to realize the algorithm.The images of related components are made,and are test under program.The experimental result proves that the proposed method inspect two types of SMD defect correctly. |
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| Keywords: | SMT defect inspection binary-projection AOI PCB |
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