Electrical Properties of a Bismuth Layer-Structured Ba2Bi4Ti5O18 Single Crystal |
| |
Authors: | Hiroshi Irie Masaru Miyayama Tetsuichi Kudo |
| |
Affiliation: | Research Center for Advanced Science and Technology (RCAST), The University of Tokyo, Tokyo 153-8904, Japan;Institute of Industrial Science, The University of Tokyo, Tokyo 106-8558, Japan |
| |
Abstract: | Ba2Bi4Ti5O18 single crystals were grown, and their dielectric permittivity, conductivity, and ferroelectricity were investigated along the a -(or b -)axis and the c -axis separately. The dielectric permittivity at 1 MHz along the a -(or b -)axis was 2000 at the Curie temperature (360°C); this value was 8 times greater than that along the c -axis. The dc conductivity was greater along the a -(or b -)axis than that along the c -axis, by one order of magnitude. In regard to the ferroelectricity, the saturated remanent polarization was 120 mC/m2 and the saturated coercive field was 3 MV/m along the a -(or b -)axis; values of 8.5 mC/m2 and 0.81 MV/m, respectively, were observed along the c -axis. The Ba2Bi4Ti5O18 single crystals had large electrical anisotropies, which were due to the layered structure. |
| |
Keywords: | bismuth titanates electrical properties dielectric materials/properties |
|
|