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Consequence of electron scattering mechanisms on the conductivity of semi-metal films |
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| Authors: | D. Deschacht A. Boyer E. Groubert C. R. Pichard A. T. Tosser C. R. Tellier |
| Affiliation: | (1) Laboratoire de Physique Appliquée, Centre d'Etudes d'Electronique des Solides associé au C.N.R.S, LA. 21, Université des Sciences et Techniques du Languedoc, 34060 Montpellier Cedex, France;(2) Laboratoire d'Electronique Université de Nancy 1, C.O. 140 54037 Nancy Cedex, France;(3) Laboratoire de Chronométrie et Piézoélectricité, E.N.S de Micromécanique et de Microtechniques, Route de Gray, 25030 BesanÇon Cedex, France |
| Abstract: | A general expression for the resistivity of an infinitely thick polycrystalline semi-metal films is calculated starting from the Mayadas-Shatzkes conduction model. Good agreement with the experimental data related to antimony films is observed. Variations of the thermaly dependent term in conductivity with conductivity at low temperature cannot be neglected. |
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